Keun Lee // Seoul National University, South KoreaTo the profile
Measuring and Analyzing the National and Regional Innovation Systems Around the WorldResearch Seminars
Methods and Analysis Using Patent Data
In this ZEW Research Seminar, quantitative methods for measuring national and regional innovation systems (NIS and RIS) using patent citation data will be presented. Relevant variables will be explained, such as technology cycle time, knowledge localization vs. internationalization, technological diversification, concentration of applicants, and originality. Keun Lee will refer to two recent works on the concepts of NIS (Lee et al. 2021) and RIS (Kim and Lee 2022), respectively, to analyze the evolving variants of different types of NIS or RIS and link them to economic performance. He will also highlight ongoing comparative work to analyze the RIS of 30 cities around the world, including in Europe and emerging economies.
Senior ResearcherTo the profile
L 7, 1, 68161 Mannheim
- Room 1